the characterization of a bsi scmos as a soft x-ray detector
首发时间:2018-11-20
abstract:we test a newly developed back-side illumination scientific cmos (bsi scmos) device for x-ray imaging spectroscopy. this bsi scmos has an array of 2048*2048 pixels with 11 um pixel size and 3.6 um epitaxial thickness. it is an active pixel sensor with fast read-out, low power consumption, low readout noise and inherent radiation hardness. we have investigated the performances. the readout noise is 1.5 e- r.m.s. enc with energy resolution of 187 ev (3.2%) at 5.9 kev at -20oc. the dark currents as a function of temperature were also measured. this bsi scmos would be a quite promising device for x-ray applications.
keywords: x-rays
点击查看论文中文信息
应用于x射线探测的科学级背照式cmos的研究
摘要:近几年发展起来的科学级cmos探测器,具有读出速度快、低噪声、低功耗、抗辐射能力强等特性,有望满足未来空间x射线探测的需求。为检验其性能并验证应用于空间x射线探测的可能性,我们于国内率先对科学级cmos探测器的性能进行了研究,本文中的cmos包含2048*2048个像素,像素大小为11*11um,其外延层厚度为3.6um。我们对其读出噪声和暗电流进行了测试,并利用55fe放射源对其x射线响应和能量分辨率进行了研究,实验结果表明可以实现对x射线的探测。
关键词:
基金:
论文图表:
引用
导出参考文献
no.****
同行评议
勘误表
应用于x射线探测的科学级背照式cmos的研究
评论
全部评论0/1000